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Search keyword：(Subject: #Regression analysis)
Results:170items
Applied regression : an introduction / Colin Lewis-Beck, Michael S. Lewis-Beck
: pbk. - 2nd ed. - Thousand Oaks, Calif. : Sage , c2016. - (Sage publications series ; . Quantitative applications in the social sciences ; 07-22)
ID=2001656534 NCID=BB19463537
Introduction to linear regression analysis / Douglas C. Montgomery, Elizabeth A. Peck, G. Geoffrey Vining
: hbk. - 5th ed. - Hoboken, N.J. : Wiley , c2012. - (Wiley series in probability and mathematical statistics)
ID=2001643031 NCID=BB09093147
Modern regression methods / Thomas P. Ryan
: [hard]. - 2nd ed. - Hoboken, N.J. : John Wiley & Sons , c2009. - (Wiley series in probability and mathematical statistics)
ID=2001416298 NCID=BA88190072
Statistical learning from a regression perspective / Richard A. Berk
: [hard]. - New York : Springer , c2008. - (Springer series in statistics)
ID=2001404907 NCID=BA86940138
Regression analysis by example / Samprit Chatterjee, Ali S. Hadi
: cloth. - 4th ed. - Hoboken, N.J. : Wiley-Interscience , c2006. - (Wiley series in probability and mathematical statistics)
ID=2001320397 NCID=BA78320728
Applied linear regression / Sanford Weisberg
3rd ed. - Hoboken, N.J. : Wiley-Interscience , c2005. - (Wiley series in probability and mathematical statistics)
ID=2001528316 NCID=BA71631082
: cloth. - 3rd ed. - New York : Wiley , c2001. - (Wiley series in probability and mathematical statistics ; . Texts, references, and pocketbooks section)
ID=2001009418 NCID=BA51909142
Applied logistic regression / David W. Hosmer, Stanley Lemeshow
2nd ed. - New York : Wiley , c2000. - (Wiley series in probability and mathematical statistics ; . Texts and references section). - (A Wiley-Interscience publication)
ID=2000939507 NCID=BA48890873
Regression analysis by example / Samprit Chatterjee, Ali S. Hadi, Bertram Price
3rd ed. - New York : J. Wiley , c2000. - (Wiley series in probability and mathematical statistics ; . Text and references section)
ID=2000827403 NCID=BA45603512
Applied regression including computing and graphics / R. Dennis Cook, Sanford Weisberg
New York : Wiley , 1999. - (Wiley series in probability and mathematical statistics ; . Texts and references section)
ID=2001004372 NCID=BA43312654
Statistical regression with measurement error / Chi-Lun Cheng and John W. Van Ness
London : Arnold , 1999. - (Kendall's library of statistics ; 6)
ID=2000768285 NCID=BA40615616
Applied regression analysis / Norman R. Draper, Harry Smith
3rd ed. - New York : Wiley , c1998. - (Wiley series in probability and mathematical statistics ; . Texts and references section)
ID=2000851602 NCID=BA36304485
: cloth. - New York : J. Wiley , c1997. - (Wiley series in probability and mathematical statistics ; . Applied probability and statistics)
ID=2000690899 NCID=BA29406168
Multiple regression : testing and interpreting interactions / Leona S. Aiken, Stephen G. West ; with contributions by Raymond R. Reno
: pbk. - Newbury Park, Calif. : Sage Publications , 1996, c1991
ID=2001413003 NCID=BA58875581
An introduction to computational statistics : regression analysis / Robert I. Jennrich
Englewood Cliffs, N.J. : Prentice Hall , c1995
ID=2000583291 NCID=BA23822534
Alternative methods of regression / David Birkes, Yadolah Dodge
New York : John Wiley & Sons , c1993. - (Wiley series in probability and mathematical statistics). - (A Wiley-Interscience publication)
ID=2000530977 NCID=BA20717657
Random coefficient models / Nicholas T. Longford
Oxford [England] : Clarendon Press. - New York : Oxford University Press , 1993. - (Oxford statistical science series ; 11). - (Oxford science publications)
ID=2000826309 NCID=BA22711607
Measurement, regression, and calibration / Philip J. Brown
Oxford : Clarendon Press. - New York : Oxford University Press , 1993. - (Oxford statistical science series ; 12)
ID=2000538962 NCID=BA2255982X
Regression analysis by example / Samprit Chatterjee, Bertram Price
2nd ed. - New York : J. Wiley , c1991. - (Wiley series in probability and mathematical statistics ; . Applied probability and statistics)
ID=2000417401 NCID=BA13365764
Regression analysis : theory, methods, and applications / Ashish Sen, Muni Srivastava
New York ; Tokyo : Springer-Verlag , c1990. - (Springer texts in statistics)
ID=2000357304 NCID=BA10669274
