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プロセス評価 / 西澤潤一編
プロセス ヒョウカ
(半導体研究 / 半導体研究振興会編 ; 17巻 . 超LSI技術 ; 4)
| Publisher | 東京 : 工業調査会 |
|---|---|
| Year | 1981.6 |
| Codes | ID=2000246942 NCID=BN00182548
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| Language | Japanese |
|---|---|
| Size | 12, 446p : 挿図 ; 27cm |
| Notes | 執筆: 飯塚尚和ほか |
| Authors | 西澤, 潤一(1926-) <ニシザワ, ジュンイチ> |
| Subjects | NDLSH:半導体 |
| Classification | NDC8:549 NDLC:ND371 |
| Vol | PRICE:12000円 |
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| Location | Volume | Call No. | Barcode No. | Status | Comments | ISBN | Printed | Reserve | Restriction | Copy | eDDS | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Cent.Lib.,Closed Stacks, Books(Japanese) |
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537.6/HAN/17 | 0174242024 |
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1981 |
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| Central Library, Open-Stack Room |
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621.38/HAN | 0112117134 |
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1981 |
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| Information science, Shuseki denshi device |
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537.6/H192 | 3511383571 |
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1981 |
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| Information science, Nano denshi device gaku |
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537.62/H192 | 3511415000 |
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1981 |
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