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Determining nanoscale physical properties of materials by microscopy and spectroscopy / editors Mehmet Sarikaya, H. Kumar Wickramasinghe, Michael Isaacson
(Materials Research Society symposium proceedings ; v. 332)
| Publisher | [Pittsburgh, Pa. : Materials Research Society] |
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| Year | 1994 |
| Codes | ID=2000578426 NCID=BA2400346X
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| Size | xiv, 622 p. : ill ; 24 cm |
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| Notes | Includes bibliographical references and index "Symposium held November 29-December 3, 1993, Boston, Massachusetts, U.S.A." |
| Authors | Sarikaya, Mehmet Wickramasinghe, H. Kumar Isaacson, Michael (Michael Saul) |
| Subjects | LCSH:Nanostructures -- Analysis -- Congresses
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LCSH:Microscopy -- Technique -- Congresses All Subject Search LCSH:Spectrum analysis -- Congresses All Subject Search |
| Classification | LCC:Q176.8.N35 DC20:620.1/1299/0287 |
| Vol | ISBN:1558992316 |
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| Location | Volume | Call No. | Barcode No. | Status | Comments | ISBN | Printed | Reserve | Restriction | Copy | eDDS | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Information science, Nanoelectronics |
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620.1/SA29 | 3570422721 |
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1558992316 | 1994 |
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