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＜Books＞
EXAFS : basic principles and data analysis / Boon K. Teo
(Inorganic chemistry concepts ; v. 9)
| Publisher | Berlin ; Tokyo : Springer-Verlag |
|---|---|
| Year | c1986 |
| Codes | ID=2000017140 NCID=BA00175234
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| Language | English |
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| Size | xviii, 349 p. : ill. ; 25 cm |
| Notes | Bibliography: p. [223]-284 Includes index |
| Authors | *Teo, B. K. |
| Subjects | LCSH:Extended X-ray absorption fine structure |
| Classification | LCC:QC482.S6 DC19:539.7/222 NDLC:MC231 NDC8:427.55 |
| Vol | us ; ISBN:0387158332 gw ; ISBN:3540158332 |
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| Location | Volume | Call No. | Barcode No. | Status | Comments | ISBN | Printed | Reserve | Restriction | Copy | eDDS | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Northern Campus Library |
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539.7/T264 | 7870000492 |
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0387158332 | 1986 |
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