Link on this page

<Books>
Contamination control in trace element analysis / Morris Zief, James W. Mitchell
(Chemical analysis ; v. 47)

Publisher New York : Wiley
Year c1976
Codes ID=2000279220 NCID=BA04611429

Show details.

Language English
Size xiv, 262 p. : ill. ; 24 cm
Notes "A Wiley-Interscience publication."
Includes bibliographical references and index
Authors *Zief, Morris
Mitchell, James W. joint author
Subjects LCSH:Trace elements -- Analysis  All Subject Search
LCSH:Contamination (Technology)
Classification LCC:QD139.T7
DC:545
Vol ISBN:0471611697

Hide book details.

Eng., Eisei, Mizukankyou hozen kougaku
545/Z62 3520821672
0471611697 1976

 Similar Items