Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963

＜図書＞
Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963
(ASTM special technical publication ; no. 372)

本文言語	英語
大きさ	vi, 89 p. ; 23 cm
一般注記	"Sponsored by Subcommittee XI on Electron Microstructure of Metals of ASTM Committee E-4 on Metallography." This is v.5 of "ASTM advances in electron metallography series" (data based on Advances in electron metallography, v.6, 1966)
著者標目	*Symposium on Advances in electron Metallography American Society for Testing and Materials. Committee E-4 on Metallography

配架場所	巻　次	請求記号	資料番号	状　態	コメント	ISBN	刷　年	印刷	予約	利用注記	文献取寄	eDDS
本館・書庫・洋書		669.95/SY68	0170545102				1964	印刷					印刷
理・中央書庫(6号館図書室)		578.1/AM35	0025376203		洋書		1964	印刷					印刷